Semiconductor Detectors and Double Beta Decay
Goulding, F. S., Landis, D. A., Luke, P. N., Madden, N. W., Malone, D. F., Pehl, R. H., Smith, A. R.Volume:
31
Year:
1984
Language:
english
Pages:
15
DOI:
10.1109/tns.1984.4333263
File:
PDF, 4.18 MB
english, 1984