Single Event Upset Rate Predictions for Complex Logic...

IEEE Transactions on Nuclear Science 1984 Vol. 31; Iss. 6

Single Event Upset Rate Predictions for Complex Logic Systems

Diehl-Nagle, S. E., Vinson, J. E., Peterson, E. L.
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Volume:
31
Year:
1984
Language:
english
Pages:
7
DOI:
10.1109/tns.1984.4333470
File:
PDF, 1.33 MB
english, 1984
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