An HDL Simulation of the Effects of Single Event Upsets on...

IEEE Transactions on Nuclear Science 1984 Vol. 31; Iss. 6

An HDL Simulation of the Effects of Single Event Upsets on Microprocessor Program Flow

Li, K. W., Armstrong, J. R., Tront, J. G.
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Volume:
31
Year:
1984
Language:
english
Pages:
6
DOI:
10.1109/tns.1984.4333471
File:
PDF, 892 KB
english, 1984
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