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Heavy Ion-Induced Single Event Upsets of Microcircuits; A Summary of the Aerospace Corporation Test Data
Koga, R., Kolasinski, W. A.Volume:
31
Year:
1984
Language:
english
Pages:
6
DOI:
10.1109/tns.1984.4333481
File:
PDF, 1.36 MB
english, 1984