Characteristics of Hole Traps in Dry and Pyrogenic Gate...

IEEE Transactions on Nuclear Science 1984 Vol. 31; Iss. 6

Characteristics of Hole Traps in Dry and Pyrogenic Gate Oxides

Shanfield, Zef, Moriwaki, Melvin M.
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Volume:
31
Year:
1984
Language:
english
Pages:
7
DOI:
10.1109/tns.1984.4333490
File:
PDF, 1.54 MB
english, 1984
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