Dependence of X-Ray Generation of Interface Traps on Gate...

IEEE Transactions on Nuclear Science 1984 Vol. 31; Iss. 6

Dependence of X-Ray Generation of Interface Traps on Gate Metal Induced Interfacial Stress in MOS Structures

Zekeriya, Viktor, Ma, T-P.
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Volume:
31
Year:
1984
Language:
english
Pages:
6
DOI:
10.1109/tns.1984.4333493
File:
PDF, 1.17 MB
english, 1984
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