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Total Dose and Dose Rate Radiation Characterization of a Hardened EPI-CMOS Gate Array
Schroeder, J. E., Gingerich, B. L., Bechtel, G. R.Volume:
31
Year:
1984
Language:
english
Pages:
5
DOI:
10.1109/tns.1984.4333505
File:
PDF, 1.51 MB
english, 1984