Total-Dose and Dose-Rate Dependence of Proton Damage in MOS...

IEEE Transactions on Nuclear Science 1984 Vol. 31; Iss. 6

Total-Dose and Dose-Rate Dependence of Proton Damage in MOS Devices during and after Irradiation

Stassinopoulos, E. G., Brucker, G. J., Van Gunten, O.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
31
Year:
1984
Language:
english
Pages:
4
DOI:
10.1109/tns.1984.4333527
File:
PDF, 958 KB
english, 1984
Conversion to is in progress
Conversion to is failed