An Investigation into Radiation Induced Second Breakdown in...

IEEE Transactions on Nuclear Science 1984 Vol. 31; Iss. 6

An Investigation into Radiation Induced Second Breakdown in N Channel Power MOSFETs

Jobson-Scott, David M
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Volume:
31
Year:
1984
Language:
english
Pages:
5
DOI:
10.1109/tns.1984.4333539
File:
PDF, 622 KB
english, 1984
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