A Comparison of Ionizing Radiation and Hot Electron Effects...

IEEE Transactions on Nuclear Science 1984 Vol. 31; Iss. 6

A Comparison of Ionizing Radiation and Hot Electron Effects in MOS Structures

Mikawa, R. E., Lenahan, P. M.
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Volume:
31
Year:
1984
Language:
english
Pages:
3
DOI:
10.1109/tns.1984.4333553
File:
PDF, 548 KB
english, 1984
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