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Low-Noise Detection System for the Counted Implantation of Single Ions in Silicon
Gauja, E., Dzurak, A.S., Andresen, S.E., Hopf, C.Y.T., Jamieson, D.N., Hearne, S.M.Volume:
55
Year:
2008
Language:
english
Pages:
5
DOI:
10.1109/tns.2008.918529
File:
PDF, 738 KB
english, 2008