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Technique for preparation and characterization in cross-section of oral titanium implant surfaces using focused ion beam and transmission electron microscopy
Tobias Jarmar, Anders Palmquist, Rickard Brånemark, Leif Hermansson, Håkan Engqvist, Peter ThomsenVolume:
87A
Year:
2008
Language:
english
Pages:
7
DOI:
10.1002/jbm.a.31856
File:
PDF, 445 KB
english, 2008