Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
2012 / 05 Vol. 6; Iss. 3
Investigation of the dependence of the photoluminescence properties of silicon nanoclusters on their volume fraction in a silicon oxide matrix
Emelyanov, A. V., Shvydun, N. V., Zhigunov, D. M., Timoshenko, V. Yu., Seminogov, V. N., Kashkarov, P. K.Volume:
6
Language:
english
Pages:
5
Journal:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
DOI:
10.1134/s1027451012060092
Date:
May, 2012
File:
PDF, 184 KB
english, 2012