Probe modification for scanning-probe microscopy by the...

Russian Microelectronics 2012 / 01 Vol. 41; Iss. 1

Probe modification for scanning-probe microscopy by the focused ion beam method

B. G. Konoplev, O. A. Ageev, V. A. Smirnov, A. S. Kolomiitsev, N. I. Serbu
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Volume:
41
Language:
english
Pages:
10
DOI:
10.1134/s1063739712010052
Date:
January, 2012
File:
PDF, 2.38 MB
english, 2012
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