Single-event-upset susceptibility simulation of sub-1-μm...

Russian Microelectronics 2012 / 03 Vol. 41; Iss. 2

Single-event-upset susceptibility simulation of sub-1-μm CMOS dual-path inverters

S. I. Ol’chev, V. Ya. Stenin
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Volume:
41
Language:
english
Pages:
11
DOI:
10.1134/s106373971201009x
Date:
March, 2012
File:
PDF, 363 KB
english, 2012
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