Effect of the concentration of uncompensated impurities on...

Semiconductors 2012 / 03 Vol. 46; Iss. 3

Effect of the concentration of uncompensated impurities on the properties of CdTe-based X- and γ-ray detectors

L. A. Kosyachenko, V. M. Sklyarchuk, S. V. Melnychuk, O. L. Maslyanchuk, E. V. Grushko, O. V. Sklyarchuk
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Volume:
46
Language:
english
Pages:
8
DOI:
10.1134/s1063782612030153
Date:
March, 2012
File:
PDF, 263 KB
english, 2012
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