Atomic Force Microscopy Investigation of Ion-bombarded InP: Effect of Angle of Ion Bombardment
Demanet, C. M., Vijaya Sankar, K., Malherbe, J. B.Volume:
24
Language:
english
Pages:
8
Journal:
Surface and Interface Analysis
DOI:
10.1002/(sici)1096-9918(199608)24:83.0.co;2-z
Date:
August, 1996
File:
PDF, 1.46 MB
english, 1996