Structural relaxation and defect annihilation in pure amorphous silicon
Roorda, S., Sinke, W., Poate, J., Jacobson, D., Dierker, S., Dennis, B., Eaglesham, D., Spaepen, F., Fuoss, P.Volume:
44
Year:
1991
Language:
english
Pages:
24
DOI:
10.1103/physrevb.44.3702
File:
PDF, 1.41 MB
english, 1991