Etalonnage absolu d’un spectrometre SISAM

Applied Optics 1970 Vol. 9; Iss. 7

Etalonnage absolu d’un spectrometre SISAM

Farrenq, R., Meyer-Bourbonneux, F., Pinson, P., Meyer, C., Barchewitz, P.
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Volume:
9
Year:
1970
Journal:
ao/9/7/ao-9-7-1587.pdf
DOI:
10.1364/AO.9.001587
File:
PDF, 371 KB
1970
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