Threshold of detection for various materials at 106 µm
Sollid, Jon E., Thomas, Scott J., Foley, Edward, Phipps, Jr., Claude R.Volume:
17
Year:
1978
Language:
english
Journal:
ao/17/17/ao-17-17-2670_1.pdf
DOI:
10.1364/AO.17.2670_1
File:
PDF, 969 KB
english, 1978