Focal plane temperature stability requirements for thermal...

Applied Optics 1979 Vol. 18; Iss. 15

Focal plane temperature stability requirements for thermal imaging systems using extrinsic Si:ln detectors

LoVecchio, P., Daly, P. J.
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Volume:
18
Year:
1979
Language:
english
Journal:
ao/18/15/ao-18-15-2598.pdf
DOI:
10.1364/AO.18.002598
File:
PDF, 557 KB
english, 1979
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