Substrate parameter determination for thin film...

Applied Optics 1983 Vol. 22; Iss. 8

Substrate parameter determination for thin film spectrophotometric measurement correction

Matzeu, M., Panatta, A.
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Volume:
22
Year:
1983
Language:
english
Journal:
ao/22/8/ao-22-8-1247.pdf
DOI:
10.1364/AO.22.001247
File:
PDF, 406 KB
english, 1983
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