Measuring refractive index and thickness of thin films: a...

Applied Optics 1983 Vol. 22; Iss. 20

Measuring refractive index and thickness of thin films: a new technique

Ding, Tie-Nan, Garmire, Elsa
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Volume:
22
Year:
1983
Language:
english
Journal:
ao/22/20/ao-22-20-3177.pdf
DOI:
10.1364/AO.22.003177
File:
PDF, 650 KB
english, 1983
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