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Extreme UV measurements of a varied line-space Hitachi reflection grating: efficiency and scattering; erratum
Edelstein, Jerry, Hettrick, Michael C., Mrowka, Stanley, Jelinsky, Patrick, Martin, ChristopherVolume:
24
Year:
1985
Journal:
ao/24/2/ao-24-2-153.pdf
DOI:
10.1364/AO.24.000153
File:
PDF, 345 KB
1985