Inversion of normal-incidence (R,T) measurements to obtain...

Applied Optics 1986 Vol. 25; Iss. 4

Inversion of normal-incidence (R,T) measurements to obtain n + ik for thin films

Paulick, Thomas C.
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Volume:
25
Year:
1986
Language:
english
Journal:
ao/25/4/ao-25-4-562.pdf
DOI:
10.1364/AO.25.000562
File:
PDF, 348 KB
english, 1986
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