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Determination of (n,k) for absorbing thin films using reflectance measurements
Siqueiros, J. M., Regalado, Luis E., Machorro, R.Volume:
27
Year:
1988
Language:
english
Journal:
ao/27/20/ao-27-20-4260.pdf
DOI:
10.1364/AO.27.004260
File:
PDF, 598 KB
english, 1988