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Extreme UV and x-ray scattering measurements from a rough LiF crystal surface characterized by electron micrography
Alehyane, Najib, Arbaoui, Mohammed, Barchewitz, Robert, André, Jean-Michel, Christensen, Finn E., Hornstrup, Allan, Palmari, Jacqueline, Rasigni, Monique, Rivoira, Réné, Rasigni, GeorgesVolume:
28
Year:
1989
Language:
english
Journal:
ao/28/10/ao-28-10-1763.pdf
DOI:
10.1364/AO.28.001763
File:
PDF, 1.57 MB
english, 1989