Infrared ellipsometer for the study of surfaces, thin...

Infrared ellipsometer for the study of surfaces, thin films, and superlattices

Bremer, J., Hunderi, O., Fanping, Kong, Skauli, T., Wold, E.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
31
Year:
1992
Language:
english
Journal:
ao/31/4/ao-31-4-471.pdf
DOI:
10.1364/AO.31.000471
File:
PDF, 1.01 MB
english, 1992
Conversion to is in progress
Conversion to is failed