Infrared ellipsometer for the study of surfaces, thin films, and superlattices
Bremer, J., Hunderi, O., Fanping, Kong, Skauli, T., Wold, E.Volume:
31
Year:
1992
Language:
english
Journal:
ao/31/4/ao-31-4-471.pdf
DOI:
10.1364/AO.31.000471
File:
PDF, 1.01 MB
english, 1992