![](/img/cover-not-exists.png)
Automated spatially scanning ellipsometer for retardation measurements of transparent materials
Hayden, J. E., Jacobs, S. D.Volume:
32
Year:
1993
Language:
english
Journal:
ao/32/31/ao-32-31-6256.pdf
DOI:
10.1364/AO.32.006256
File:
PDF, 1.18 MB
english, 1993