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Empirical relations among scattering, roughness parameters, and thickness of aluminum films
Larruquert, J. I., Méndez, J. A., Aznárez, J. A.Volume:
32
Year:
1993
Language:
english
Journal:
ao/32/31/ao-32-31-6341.pdf
DOI:
10.1364/AO.32.006341
File:
PDF, 699 KB
english, 1993