Determination of the longitudinal profile of a focused...

Determination of the longitudinal profile of a focused Nd:YAG Gaussian beam from second-harmonic generation in a thin KTP crystal

Fève, J. P., Boulanger, B., Marnier, G.
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Volume:
33
Year:
1994
Language:
english
Journal:
ao/33/15/ao-33-15-3169.pdf
DOI:
10.1364/AO.33.003169
File:
PDF, 705 KB
english, 1994
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