Mueller matrix analysis of infrared ellipsometry

Applied Optics 1994 Vol. 33; Iss. 25

Mueller matrix analysis of infrared ellipsometry

Wold, Erik, Bremer, Johannes
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Volume:
33
Year:
1994
Language:
english
Journal:
ao/33/25/ao-33-25-5982.pdf
DOI:
10.1364/AO.33.005982
File:
PDF, 1.50 MB
english, 1994
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