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Prediction of the bidirectional reflectance-distribution function from atomic-force and scanning-tunneling microscope measurements of interfacial roughness
Bruno, William M., Roth, James A., Burke, Philip E., Hewitt, William B., Holmbeck, Randal E., Neal, Dennis G.Volume:
34
Year:
1995
Language:
english
Journal:
ao/34/7/ao-34-7-1229.pdf
DOI:
10.1364/AO.34.001229
File:
PDF, 320 KB
english, 1995