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Neural network approach to holographic nondestructive testing
Kreis, Thomas, Jüptner, Werner, Biedermann, RalfVolume:
34
Year:
1995
Language:
english
Journal:
ao/34/8/ao-34-8-1407.pdf
DOI:
10.1364/AO.34.001407
File:
PDF, 4.50 MB
english, 1995