Determining the refractive index and average thickness of AsSe semiconducting glass films from wavelength measurements only
Corrales, C., Ramírez-Malo, J., Fernández-Peña, J., Villares, P., Swanepoel, R., Márquez, E.Volume:
34
Year:
1995
Language:
english
Journal:
ao/34/34/ao-34-34-7907.pdf
DOI:
10.1364/AO.34.007907
File:
PDF, 156 KB
english, 1995