Image resolution in reflection scanning near-field optical...

Image resolution in reflection scanning near-field optical microscopy using shear-force feedback: characterization with a spline and Fourier spectrum

Barchiesi, Dominique, Bergossi, Olivier, Spajer, Michel, Pieralli, Christian
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Volume:
36
Year:
1997
Language:
english
Journal:
ao/36/10/ao-36-10-2171.pdf
DOI:
10.1364/AO.36.002171
File:
PDF, 1.25 MB
english, 1997
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