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Analysis and compensation of the measurement error in a lock-in amplifier used for wavelength shift measurements in optical sensing application
Shi, W. J., Ning, Y. N., Grattan, K. T. V., Palmer, A. W.Volume:
36
Year:
1997
Language:
english
Journal:
ao/36/22/ao-36-22-5482.pdf
DOI:
10.1364/AO.36.005482
File:
PDF, 264 KB
english, 1997