Fast Surface Profiling by Spectral Analysis of White-Light Interferograms with Fourier Transform Spectroscopy
Hart, Matthew, Vass, David G., Begbie, Mark L.Volume:
37
Year:
1998
Language:
english
Journal:
ao/37/10/ao-37-10-1764.pdf
DOI:
10.1364/AO.37.001764
File:
PDF, 243 KB
english, 1998