Reflectance Measurements and Optical Constants in the Extreme Ultraviolet for Thin Films of Ion-Beam-Deposited SiC, Mo, Mg_2Si, and InSb and of Evaporated Cr
Larruquert, Juan I., Keski-Kuha, Ritva A. M.Volume:
39
Year:
2000
Language:
english
Journal:
ao/39/16/ao-39-16-2772.pdf
DOI:
10.1364/AO.39.002772
File:
PDF, 159 KB
english, 2000