High-Resolution Scanning Surface-Plasmon Microscopy
Somekh, Michael G., Liu, Shugang, Velinov, Tzvetan S., See, Chung WahVolume:
39
Year:
2000
Language:
english
Journal:
ao/39/34/ao-39-34-6279.pdf
DOI:
10.1364/AO.39.006279
File:
PDF, 1.41 MB
english, 2000