Quantitative Analysis of Decay Transients Applied to a...

Quantitative Analysis of Decay Transients Applied to a Multimode Pulsed Cavity Ringdown Experiment

Naus, Hans, van Stokkum, Ivo H. M., Hogervorst, Wim, Ubachs, Wim
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Volume:
40
Year:
2001
Language:
english
Journal:
ao/40/24/ao-40-24-4416.pdf
DOI:
10.1364/AO.40.004416
File:
PDF, 191 KB
english, 2001
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