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Fourier Analysis Near-Field Polarimetry for Measurement of Local Optical Properties of Thin Films
Fasolka, Michael J., Nougier, Sophie, Nguyen, Hoang-Phi, Bryant, Garnett W., Hwang, Jeeseong, Weston, Kenneth D., Beers, Kathryn L., Urbas, Augustine, Thomas, Edwin L., Goldner, Lori S.Volume:
42
Year:
2003
Language:
english
Journal:
ao/42/19/ao-42-19-3864.pdf
DOI:
10.1364/AO.42.003864
File:
PDF, 2.13 MB
english, 2003