Fourier Analysis Near-Field Polarimetry for Measurement of...

Applied Optics 2003 Vol. 42; Iss. 19

Fourier Analysis Near-Field Polarimetry for Measurement of Local Optical Properties of Thin Films

Fasolka, Michael J., Nougier, Sophie, Nguyen, Hoang-Phi, Bryant, Garnett W., Hwang, Jeeseong, Weston, Kenneth D., Beers, Kathryn L., Urbas, Augustine, Thomas, Edwin L., Goldner, Lori S.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
42
Year:
2003
Language:
english
Journal:
ao/42/19/ao-42-19-3864.pdf
DOI:
10.1364/AO.42.003864
File:
PDF, 2.13 MB
english, 2003
Conversion to is in progress
Conversion to is failed