Topographic Profiling and Refractive-Index Analysis by Use of Differential Interference Contrast with Bright-Field Intensity and Atomic Force Imaging
Axelrod, Noel, Radko, Anna, Lewis, Aaron, Ben-Yosef, NissimVolume:
43
Year:
2004
Language:
english
Journal:
ao/43/11/ao-43-11-2272.pdf
DOI:
10.1364/AO.43.002272
File:
PDF, 1.42 MB
english, 2004