Total Internal Reflection Ellipsometry: Principles and...

Total Internal Reflection Ellipsometry: Principles and Applications

Arwin, Hans, Poksinski, Michal, Johansen, Knut
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Volume:
43
Year:
2004
Language:
english
Journal:
ao/43/15/ao-43-15-3028.pdf
DOI:
10.1364/AO.43.003028
File:
PDF, 257 KB
english, 2004
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