Total Internal Reflection Ellipsometry: Principles and Applications
Arwin, Hans, Poksinski, Michal, Johansen, KnutVolume:
43
Year:
2004
Language:
english
Journal:
ao/43/15/ao-43-15-3028.pdf
DOI:
10.1364/AO.43.003028
File:
PDF, 257 KB
english, 2004