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Three-Dimensional Deformation Measurement from the Combination of In-Plane and Out-Of-Plane Electronic Speckle Pattern Interferometers
Martínez, Amalia, Rayas, Juan A., Rodríguez-Vera, Ramón, Puga, Héctor J.Volume:
43
Year:
2004
Language:
english
Journal:
ao/43/24/ao-43-24-4652.pdf
DOI:
10.1364/AO.43.004652
File:
PDF, 484 KB
english, 2004