Measurements of detector nonlinearity at 193 nm

Applied Optics 2005 Vol. 44; Iss. 6

Measurements of detector nonlinearity at 193 nm

Laabs, Holger, Keenan, Darryl A., Yang, Shao, Dowell, Marla L.
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Volume:
44
Year:
2005
Language:
english
Journal:
ao/44/6/ao-44-6-841.pdf
DOI:
10.1364/AO.44.000841
File:
PDF, 148 KB
english, 2005
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