Rapid subsurface detection of nanoscale defects in live...

Rapid subsurface detection of nanoscale defects in live microprocessors by functional infrared emission spectral microscopy

Saloma, Caesar, Tarun, Alvarado, Bailon, Michelle, Soriano, Maricor
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Volume:
44
Year:
2005
Language:
english
Journal:
ao/44/34/ao-44-34-7302.pdf
DOI:
10.1364/AO.44.007302
File:
PDF, 460 KB
english, 2005
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