Ellipsometry of reflected and scattered fields for the...

Ellipsometry of reflected and scattered fields for the analysis of substrate optical quality

Deumié, Carole, Gilbert, Oliver, Georges, Gaelle, Arnaud, Laurent, Amra, Claude
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Volume:
45
Year:
2006
Language:
english
Journal:
ao/45/7/ao-45-7-1640.pdf
DOI:
10.1364/AO.45.001640
File:
PDF, 1.30 MB
english, 2006
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