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Three-wavelength electronic speckle pattern interferometry with the Fourier-transform method for simultaneous measurement of microstructure-scale deformations in three dimensions
Flynn, Eric B., Bassman, Lori C., Smith, Timothy P., Lalji, Zamir, Fullerton, Laurel H., Leung, Tommy C., Greenfield, Scott R., Koskelo, Aaron C.Volume:
45
Year:
2006
Language:
english
Journal:
ao/45/14/ao-45-14-3218.pdf
DOI:
10.1364/AO.45.003218
File:
PDF, 1.49 MB
english, 2006