Investigation of the effect of accumulation of thickness...

Applied Optics 2006 Vol. 45; Iss. 27

Investigation of the effect of accumulation of thickness errors in optical coating production by broadband optical monitoring

Tikhonravov, Alexander V., Trubetskov, Michael K., Amotchkina, Tatiana V.
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Volume:
45
Year:
2006
Language:
english
Journal:
ao/45/27/ao-45-27-7026.pdf
DOI:
10.1364/AO.45.007026
File:
PDF, 125 KB
english, 2006
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